IC

(Ion Chromatography)

ICP-OES

ICP-MS

NMR (Liquid)

NMR (Solid)

Organic Elements

CHNS-O

SEM

SEM-EDS

TEM

TEM-EDS

TG-DSC

TGA / DSC

TPR

TPD

S/N

Testing Service

Remarks

1

AFM

• Equipment: Bruker Dimension Icon

• Sample size: substrate > 5*5 mm, with flat surface

• Total 6 scanning: 2 different locations*3 different magnifications

• Original data provided for data analysis, such as 3D structure, height profile, etc.

2

BET

• Equipment model:

• Micromeritics ASAP-2460 for mesopore (2-50 nm range)

• Micromeritics ASAP-2020 for micropore (0-50 nm range)

• Sample amount: powder > 1 g (carbon materials with large specific surface area can be > 0.2 g)

• Testing in standard N2 atmosphere

• Full set testing report with excel data

• Extra services available:

• BET testing in CO2 gas at 0 °C and RT

3

FTIR

• Equipment: Nicolet IS10, US

• Sample amount: solution 3-5 mL, powder of red bean size

• Wavenumber range: 400-4000 cm-1, corresponds to 25-2.5 um wavelength

• Can test organic solution, solid samples

• Cannot test aqueous solution

• Extra services available:

• ATR mode

• Peak analysis (corresponding chemical bond)

4

IC (Ion Chromatography)

• Equipment: Dionex ICS-1600, US

• Sample amount: solution 3-5 mL

• Can test: F, Cl, Br, NO2, NO3, SO4, PO4

• Cannot test: CO3, HCO3

5

ICP-OES / ICP-MS

• Equipment: Agilent 720 for ICP-OES, Agilent 7700s for ICP-MS

• Sample amount: solution 3-5 mL, powder >0.5 g, big bulk samples are difficult to digest

• Detection limit: 20 ppb for ICP-OES, 1 ppb for ICP-MS

• Extra services available:

• General scan of 40 elements

• Rare earth elements

• Free acid digestion of solid or organic solution samples

6

NMR (Liquid)

• Equipment: Bruker AVANCE III 600

• Sample amount: solution 3-5 mL

• Standard testing of H/C spectra

• Extra elements: B. P, F, Cl, Si, Al, Pb, Br

7

NMR (Solid)

• Equipment: Bruker AVANCE III 600

• Sample amount: powder >0.5 g

• Standard testing of H/C spectra

• Extra elements: B. P, F, Cl, Si, Al, Pb, Br

8

Organic element analyzer (CHNS-O)

• CHNS can be tested together, but O needs to be tested separated using different attachment

• Sample amount: powder >0.1 g

• Detection limit: 0.1 wt%

• Need sample weight > 50 mg

9

Raman

• Laser sources: 325, 514, 532, 633, 785 nm

• Sample size: substrate > 5*5 mm, powder of red bean size

• Repeated scanning from 3 different locations

10

SEM

• Equipment: Hitachi SU8020

• Sample size: substrate > 5*5 mm, powder of red bean size

• 10-15 images for each sample from 2 different locations

• Extra services available:

• EDS (point detection, line scanning, areal mapping)

• Sample preparation from bulk material

11

TEM

• Equipment: FEI Talos F200

• Sample requirements:

• Nanomaterial in powder or dispersion

• Nanomaterial grown on substrate

• Samples prepared on TEM grids

• Thin film/bulk samples > 10 mm size

• Extra services available:

• HRTEM

• SAED

• EDS

• STEM

• Cs-corrected STEM

• TEM sample preparation from bulk and thin film samples

12

TG-DSC

(TGA and DSC)

• Equipment: Mettler Toledo TG-DSC 3+

• Sample amount: powder >0.1 g

• Testing modes:

• TG-DSC mode: with TGA and DSC, heating only, max 1000 °C

• DSC mode: DSC curve only, with heating and cooling curves, max 500 °C

• Extra services available:

• Specific heat capacity testing

• Testing in N2, Ar, CO2, air atmosphere

• Liquid sample testing

13

TPR / TPD

• TPR in 5 vol% H2/N2 atmosphere

• TPD in H2, CO2, NH3, as well as CO, NO, NO2 atmosphere

• Sample amount: powder >0.5 g

• Temperature range: RT – 950 °C

14

XPS

• Equipment: PHI-5400, Physical Electronics, US

• Sample size: substrate > 5*5 mm, powder of red bean size

• Extra services available:

• Ar ion etching

• XPS depth profiling (< 500 nm)

• Valance band structure testing

• Peak deconvolution services

15

XRF

• Equipment: Shimadzu XRF-1800, with Rh X-ray tube

• Sample size: powder 3-5 g, bulk < Dia 30 * Thickness 20 mm

• Detection limit: 0.01 wt% (~100 ppm)

• Cannot detect light elements before O (such as H, C, N, etc)

• Provide results in elemental and oxide form

16

XRD

• Equipment: Bruker D8 ADVANCE

• Sample amount: substrate > 10*10 mm, powder of red bean size

• Standard conditions: 2θ range 5-90°, scanning rate 3°/min

• Extra services available:

• GID: Grazing Incidence Diffraction

• High temperature scanning

• XRD data analysis: both qualitative and quantitative