Nanoscale surface structure analysis
Atomic Force Microscope (AFM)
Bruker Dimension Icon
• Substrate > 5*5 mm, with flat surface
|Remarks:||• We provide multiple scannings for each sample, from different locations with different magnifications.|
• Original data provided for data analysis, such as 3D structure, height profile, etc.
• 7 Working Days
Free sample collection within Singapore!
Contact us now (firstname.lastname@example.org) to arrange your testing slots!