AFM Testing Services

Nanoscale surface structure analysis

Test Method:

Atomic Force Microscope (AFM)


Bruker Dimension Icon

Sample Size:

• Substrate > 5*5 mm, with flat surface
• Powder samples

Remarks:• We provide multiple scannings for each sample, from different locations with different magnifications.
• Original data provided for data analysis, such as 3D structure, height profile, etc.

Test Time:

• 7 Working Days

Useful Links:

AFM on Wikipedia

Free sample collection within Singapore!

Contact us now ( to arrange your testing slots!