Test Method:

TEM (Transmission Electron Microscopy)

Equipment:

JEOL 2100F / Tecnai F30 / Tecnai T12

Magnification:

Up to 1.5 million

Voltage:

120 / 200 / 300 kV

Applications:

• Morphological characterizations

• Atomic scale observations and analyses

• Compositional analyses

Test Modes:

Low magnification image

• Default basic services
• Magnifications below 500 K

HRTEM

• High-resolution image (atomic-resolution)

TEM-EDS

• EDS (Energy-Dispersive Spectroscopy)

• Point-detection / Line scanning / Mapping

S-TEM

• Scanning Transmission Electron Microscopy

Test Time:

• 7 Working Days

Useful Links:

• TEM on Wikipedia

• EDS on Wikipedia

• EELS on Wikipedia

• ET on Wikipedia